Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
نویسندگان
چکیده
منابع مشابه
Polychromatic Maximum Likelihood Reconstruction for Talbot-Lau X-ray Tomography
Compared to conventional attenuation imaging, Talbot-Lau X-ray grating interferometry applied within a polychromatic setup suffers from additional artifacts. Among those are beam hardening and dispersion effects due to the complex coupling of different physical effects involved in the image formation process. In computed tomography these effects lead to image degradation, such as cupping and st...
متن کاملSimulation framework for coherent and incoherent X-ray imaging and its application in Talbot-Lau dark-field imaging.
A simulation framework for coherent X-ray imaging, based on scalar diffraction theory, is presented. It contains a core C++ library and an additional Python interface. A workflow is presented to include contributions of inelastic scattering obtained with Monte-Carlo methods. X-ray Talbot-Lau interferometry is the primary focus of the framework. Simulations are in agreement with measurements obt...
متن کاملPhase Tomography by X-ray Talbot Interferometry for Biological Imaging
Department of Advanced Materials Science, School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan Laboratory of Advanced Science and Technolog...
متن کاملPhase Imaging with an X-ray Talbot Interferometer
X-ray Talbot interferometry (XTI) is described as a novel phase-sensitive X-ray imaging method. XTI uses two transmission gratings, and therefore in principle it functions with cone-beam X-rays of a broad energy band width, allowing its instrumentation with a compact X-ray source. Because an amplitude transmission grating is needed, X-ray lithography and electrochemical gold plating were employ...
متن کاملTheory of oblique and grazing incidence Talbot‑Lau interferometers and demonstration in a compact source x‑ray reflective interferometer
With the advent of Talbot-Lau interferometers for x-ray phase-contrast imaging, oblique and grazing incidence configurations are now used in the pursuit of sub-micron grating periods and high sensitivity. Here we address the question whether interferometers having oblique incident beams behave in the same way as the well-understood normal incidence ones, particularly when the grating planes are...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2021
ISSN: 0034-6748,1089-7623
DOI: 10.1063/5.0043655